Micro X-ray Computed Tomography

3D imaging in high resolution

The Zeiss Xradia Versa 620 is an X-ray Microscope(XRM) and X-ray Computed Tomography (X-ray CT) scanner capable of achieving sub-micron resolution. X-ray CT is a method to image the 3D volume of a sample and show differences in x-ray attenuation of the materials.

With the additional LabDCT module, the Zeiss Xradia Versa 620 is also able to collect 3D diffraction patterns from grains, which allows to reconstruct grain orientation and volume of polycrystalline materials.

This new instrument has been purchased with the help of the EPSRC strategic equipment grant number EP/V007610/1, awarded to PI Prof Kate Black and Co-PIs Prof Richard Worden and Prof Rachel Williams. Dr Julia Behnsen is providing technical support for the instrument.

Method Schematic of the Versa 620


How X-ray CT and labDCT work in the Zeiss Xradia Versa 620.

Research Look into a procine eye, scanned with x-ray CT

Recent research

Examples of recent research carried out with the help of the Zeiss Xradia Versa 620 XRM.

XCT Access Door opening and showing the Zeiss Versa


How to get access for academic research and industry applications.