Scanning Tunnelling Microscope (STM)

Scanning Tunnelling Microscope (STM) is a non-contact technique which provides high resolution topographic information of conducting surfaces.

  • STM is a non-contact technique which provides high resolution topographic information of conducting surfaces
  • A small current between the STM tip and the sample allows us to probe the electronic states of the surface with atomic resolution
  • STM can be performed in vacuum, allowing for precise measurement control, or ambient conditions; or in fluids
  • Can be used conjunction with electrochemical techniques, such as electrodeposition of metals, the surface properties can be monitored in situ.

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