Micro X-ray Computed Tomography

The Zeiss Xradia Versa 620 is an X-ray Microscope(XRM) and X-ray Computed Tomography (X-ray CT) scanner capable of achieving sub-micron resolution. X-ray CT is a method to image the 3D volume of a sample and show differences in x-ray attenuation of the materials.

3D imaging in high resolution

With the additional LabDCT module, the Zeiss Xradia Versa 620 is also able to collect 3D diffraction patterns from grains, which allows to reconstruct grain orientation and volume of polycrystalline materials.

This new instrument has been purchased with the help of the EPSRC strategic equipment grant number EP/V007610/1, awarded to PI Prof Kate Black and Co-PIs Prof Richard Worden and Prof Rachel Williams. Dr Julia Behnsen is providing technical support for the instrument.

Recent publications using the Zeiss Xradia Versa 620 can be found here.