The JEOL JSM 7001F FEG-SEM houses a retractable BSE detector and an Oxford Instruments Ultim-Max EDS detector with AZtec software for chemical compositional analysis.
It is suited for high-resolution secondary and backscatter electron imaging, with EDS point or mapping analysis.
It comprises a small chamber that can house up to 3 x 12.5mm diameter aluminium pin stubs. Specialist holders allow for mounting of 1.5” epoxy pucks, samples in cross-section, and analysis of TEM grids. AZtec Live allows for simultaneous analysis of sample morphology and elemental distribution in real time.
Back to: Scanning Electron Microscopy Shared Research Facility (SEM SRF)