JEOL JSM 6610 SEM

Utilises a thermionic tungsten (W) filament up to 30 kV offering a resolution down to 3.0 nm. Equipped with Oxford Xplore EDS detector.

The JEOL JSM 6610 SEM is a general-purpose instrument meeting the needs of a wide range of academic and industrial users, and ideally suited for routine SE and BSE imaging, and introducing new users to scanning electron microscopy.

It is equipped with an Oxford Xplore EDS detector with AZtec software for chemical composition analysis.

It comprises a large specimen chamber for larger (up to eight-inch diameter, 50mm height) samples, or up to seven 12.5mm diameter aluminium pin stubs. Specialist holders allow for mounting of 1.5” epoxy pucks, samples in cross-section, and analysis of TEM grids. AZtec Live allows for simultaneous analysis of sample morphology and elemental distribution in real time.