Dr Khursheed is currently working as a lecturer (Assistant Professor) with Department of Electrical Engineering and Electronics, University of Liverpool, UK. In 2010, he received his PhD degree in Electronics and Electrical Engineering from University of Southampton, UK. After completing his PhD, he worked as a Senior Research Fellow at the University of Southampton on two EPSRC funded research projects.
Dr Khursheed's PhD thesis secured second place in IEEE TTTC 'E. J. McCluskey Doctoral Thesis Award' at European Test Symposium (ETS 2010), while competing against the best PhD dissertations from all over Europe. He was also the winner of PhD-Plus award (2009-10).
Dr Khursheed is interested in all issues related to reliability, testability, yield improvement and hardware oriented security of low-power, high-performance designs and 3D integrated circuits. He has published a number of papers in internationally leading journals and conferences in these areas. He is the General Co-Chair and Finance Chair of 31st edition of IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2018), Chicago (USA). In 2017, he served as Program Co-Chair of this symposium, which took place in Cambridge (UK). He served as the Guest Editor for a special section on “Robust 3-D Stacked ICs” in IEEE Design & Test magazine (May/June 2016 issue) and special session co-chair of European Test Symposium (ETS 2016). He also served as the Program Chair (2012) and General Chair (2013-15) of Friday workshop on 3D Integration, collocated with the DATE Conference. Currently, he is serving as a member of technical program committee of Asian Test Symposium (ATS 2015-), European Test Symposium (ETS 2012-13; ETS 2016-), HOST (2018-), VLSI-SOC (2015-16), ITC-ASIA (2017-) and other conferences. He regularly reviews research papers for internationally leading journals and conferences. He is a member of IEEE, member of EPSRC peer review college and Fellow of The Higher Education Academy (UK).