Cynthia J.
Jenks
Ames
Laboratory, Iowa State University, Ames, IA 50011 USA
Angle-resolved
low energy ion scattering is one of a few techniques that is truly sensitive to
the topmost layer of a surface.
Information about surface symmetry, atomic distances and composition can
be obtained. We have used this
technique to examine the five-fold surface of icosahedral Al71Pd 20Mn9. Our results are consistent with the
surface maintaining five-fold symmetry after sputtering followed by
annealing. We find that the
topmost surface layer is > 85 atomic % aluminum. A predominant neighbor atom distance of 7.6 ± 0.5 Å and a
nearest neighbor distance of 3.0 ± 0.1 Å are calculated from our results. These results are consistent with
previous low energy electron diffraction intensity versus voltage (LEED-IV)
calculations, recently published scanning tunneling microscopy results and a
bulk model of Al-Pd-Mn quasicrystals.