Reliable, Testable and Secure Designs
Dr Khursheed is interested in all issues related to reliability, testability, and hardware oriented security of low-power, high-performance designs and 3D integrated circuits. He has published a number of papers in internationally leading journals and conferences in these areas.
eFutures Sandpit Award: StRIDE: Secure and Reliable Microelectronics Design
ENGINEERING & PHYSICAL SCIENCES RESEARCH COUNCIL (EPSRC)
February 2018 - September 2018