Photo of Dr Saqib Khursheed

Dr Saqib Khursheed BE, MSc, PhD, FHEA

Lecturer (Assistant Professor) Electrical Engineering and Electronics

    Publications

    2020

    Differential Aging Sensor to Detect Recycled ICs using Sub-threshold Leakage Current (Conference Paper)

    Alnuayri, T., Khursheed, S. -S., Hernandez Martinez, A., & Rossi, D. (2021, February 1). Differential Aging Sensor to Detect Recycled ICs using Sub-threshold Leakage Current. In Design, Automation and Test in Europe (DATE2021).

    A Cost-Aware Framework for Lifetime Reliability of TSV based 3D-IC design (Journal article)

    Reddy, R. P., Acharyya, A., & Khursheed, S. (2020). A Cost-Aware Framework for Lifetime Reliability of TSV-Based 3D-IC Design. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 67(11), 2677-2681. doi:10.1109/TCSII.2020.2970724

    DOI: 10.1109/tcsii.2020.2970724

    Hardware Trojan Detection on a PCB Through Differential Power Monitoring (Journal article)

    Piliposyan, G., Khursheed, S. -S., & Rossi, D. (n.d.). Hardware Trojan Detection on a PCB Through Differential Power Monitoring. IEEE Transactions on Emerging Topics in Computing.

    Secure Scan Design with a Novel Methodology of Scan Camouflaging (Conference Paper)

    Kalanadhabhatta, S., Anumandla, K. K., Khursheed, S., & Acharyya, A. (2020). Secure Scan Design with a Novel Methodology of Scan Camouflaging. In 2020 European Conference on Circuit Theory and Design (ECCTD). IEEE. doi:10.1109/ecctd49232.2020.9218406

    DOI: 10.1109/ecctd49232.2020.9218406

    Leveraging CMOS Aging for Efficient Microelectronics Design (Conference Paper)

    Martinez, A. L. H., Khursheed, S., & Rossi, D. (2020). Leveraging CMOS Aging for Efficient Microelectronics Design. In 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS). IEEE. doi:10.1109/iolts50870.2020.9159742

    DOI: 10.1109/iolts50870.2020.9159742

    A Cost-Aware Framework for Lifetime Reliability of TSV-Based 3D-IC Design. (Journal article)

    Reddy, R. P., Acharyya, A., & Khursheed, S. S. (2020). A Cost-Aware Framework for Lifetime Reliability of TSV-Based 3D-IC Design.. IEEE Trans. Circuits Syst., 67-II, 2677-2681.

    LFSR generation for high test coverage and low hardware overhead (Journal article)

    Martínez, L. H., Khursheed, S., & Reddy, S. M. (2020). LFSR generation for high test coverage and low hardware overhead. IET Computers & Digital Techniques, 14(1), 27-36. doi:10.1049/iet-cdt.2019.0042

    DOI: 10.1049/iet-cdt.2019.0042

    2019

    A Framework for TSV Based 3D-IC to Analyze Aging and TSV Thermo-Mechanical Stress on Soft Errors (Conference Paper)

    Reddy, R. P., Acharyya, A., & Khursheed, S. (2019). A Framework for TSV Based 3D-IC to Analyze Aging and TSV Thermo-Mechanical Stress on Soft Errors. In 2019 IEEE International Test Conference in Asia (ITC-Asia). IEEE. doi:10.1109/itc-asia.2019.00034

    DOI: 10.1109/itc-asia.2019.00034

    Guest Editorial: Defect and Fault Tolerance in VLSI and Nanotechnology Systems (Journal article)

    Miele, A., Trefzer, M. A., & Khursheed, S. (2019). Guest Editorial: Defect and Fault Tolerance in VLSI and Nanotechnology Systems. IET COMPUTERS AND DIGITAL TECHNIQUES, 13(3), 127-128. doi:10.1049/iet-cdt.2019.0097

    DOI: 10.1049/iet-cdt.2019.0097

    Detection of Recycled ICs via On-Chip Leakage Current Sensors (Conference Paper)

    Khursheed, S., & Rossi, D. (2019, July 1). Detection of Recycled ICs via On-Chip Leakage Current Sensors. In 4th International Verification and Security Workshop (IVSW). Rhodes Island, Greece.

    Foreword (Conference Paper)

    Foreword (2018). In 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE. doi:10.1109/dft.2018.8602980

    DOI: 10.1109/dft.2018.8602980

    Fault Tolerance in 3D-ICs (Chapter)

    Reddy, R. P., Acharyya, A., & Khursheed, S. (2019). Fault Tolerance in 3D-ICs. In Internet of Things (pp. 155-178). Springer International Publishing. doi:10.1007/978-3-030-02807-7_8

    DOI: 10.1007/978-3-030-02807-7_8

    2018

    Recycled IC Detection through Aging Sensor (Conference Paper)

    Rossi, D., Tenentes, V., Khursheed, S., & Reddy, S. (2018). Recycled IC Detection through Aging Sensor. In European Test Symposium.

    Leakage Current Analysis for Diagnosis of Bridge Defects in Power-Gating Designs (Journal article)

    Tenentes, V., Rossi, D., Khursheed, S. S., Al-Hashimi, B. M., & Chakrabarty, K. (2018). Leakage Current Analysis for Diagnosis of Bridge Defects in Power-Gating Designs.. IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems, 37(4), 883-895. doi:10.1109/TCAD.2017.2729462

    DOI: 10.1109/TCAD.2017.2729462

    Welcome message (Conference Paper)

    Welcome message (2017). In 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE. doi:10.1109/dft.2017.8244425

    DOI: 10.1109/dft.2017.8244425

    2017

    Improved Wire Length-Driven Placement Technique for Minimizing Wire Length, Area and Timing (Journal article)

    Sabbavarapu, S., Basireddy, K. R., Acharyya, A., & Khursheed, S. (2017). Improved Wire Length-Driven Placement Technique for Minimizing Wire Length, Area and Timing. Journal of Low Power Electronics, 13(3), 456-471. doi:10.1166/jolpe.2017.1506

    DOI: 10.1166/jolpe.2017.1506

    A Cost-Effective Fault Tolerance Technique for Functional TSV in 3-D ICs (Journal article)

    Reddy, R. P., Acharyya, A., & Khursheed, S. (2017). A Cost-Effective Fault Tolerance Technique for Functional TSV in 3-D ICs. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 25(7), 2071-2080. doi:10.1109/TVLSI.2017.2681703

    DOI: 10.1109/TVLSI.2017.2681703

    Coarse-grained Online Monitoring of BTI Aging by Reusing Power Gating Infrastructure (Journal article)

    Tenentes, V., Rossi, D., Yang, S., Khursheed, S., Al-Hashimi, B. M., & Gunn, S. R. (2017). Coarse-grained Online Monitoring of BTI Aging by Reusing Power Gating Infrastructure. IEEE Transactions on Very Large Scale Integration Systems, 25(4), 1397-1407. doi:10.1109/TVLSI.2016.2626218

    DOI: 10.1109/TVLSI.2016.2626218

    Aging Benefits in Nanometer CMOS Designs (Journal article)

    Rossi, D., Tenentes, V., Yang, S., Khursheed, S., & Al-Hashimi, B. M. (2017). Aging Benefits in Nanometer CMOS Designs. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 64(3), 324-328. doi:10.1109/TCSII.2016.2561206

    DOI: 10.1109/TCSII.2016.2561206

    2016

    Co-optimization of fault tolerance, wirelength and temperature mitigation in TSV-based 3D ICs (Conference Paper)

    Zhao, Y., Khursheed, S., Al-Hashimi, B. M., Zhao, Z., & IEEE. (2016). Co-optimization of fault tolerance, wirelength and temperature mitigation in TSV-based 3D ICs. In 2016 IFIP/IEEE INTERNATIONAL CONFERENCE ON VERY LARGE SCALE INTEGRATION (VLSI-SOC). Retrieved from http://gateway.webofknowledge.com/

    Reconfigurable hardware-software codesign methodology for protein identification (Conference Paper)

    Khursheed, S. (2016). Reconfigurable hardware-software codesign methodology for protein identification. doi:10.1109/EMBC.2016.7591227

    DOI: 10.1109/EMBC.2016.7591227

    Reliable Power Gating With NBTI Aging Benefits (Journal article)

    Rossi, D., Tenentes, V., Yang, S., Khursheed, S., & Al-Hashimi, B. M. (2016). Reliable Power Gating With NBTI Aging Benefits. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 24(8), 2735-2744. doi:10.1109/TVLSI.2016.2519385

    DOI: 10.1109/TVLSI.2016.2519385

    Guest Editors' Introduction: Robust 3-D Stacked ICs (Journal article)

    Khursheed, S., Vivet, P., Hopsch, F., & Marinissen, E. J. (2016). Guest Editors' Introduction: Robust 3-D Stacked ICs. IEEE Design & Test, 33(3), 6-7. doi:10.1109/mdat.2016.2542210

    DOI: 10.1109/mdat.2016.2542210

    Application-Specific Memory Protection Policies for Energy-Efficient Reliable Design (Conference Paper)

    Yang, S., Shafik, R. A., Khursheed, S., Flynn, D., Merrett, G. V., Al-Hashimi, B. M., & IEEE. (2015). Application-Specific Memory Protection Policies for Energy-Efficient Reliable Design. In 2015 INTERNATIONAL SYMPOSIUM ON RAPID SYSTEM PROTOTYPING (RSP) (pp. 18-24). Retrieved from http://gateway.webofknowledge.com/

    2015

    DFT Architecture With Power-Distribution-Network Consideration for Delay-Based Power Gating Test (Journal article)

    Tenentes, V., Khursheed, S., Rossi, D., Yang, S., & Al-Hashimi, B. M. (2015). DFT Architecture With Power-Distribution-Network Consideration for Delay-Based Power Gating Test. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 34(12), 2013-2024. doi:10.1109/TCAD.2015.2446939

    DOI: 10.1109/TCAD.2015.2446939

    BTI and Leakage Aware Dynamic Voltage Scaling for Reliable Low Power Cache Memories (Conference Paper)

    Rossi, D., Tenentes, V., Khursheed, S., Al-Hashimi, B. M., & IEEE. (2015). BTI and Leakage Aware Dynamic Voltage Scaling for Reliable Low Power Cache Memories. In 2015 IEEE 21ST INTERNATIONAL ON-LINE TESTING SYMPOSIUM (IOLTS) (pp. 194-199). Retrieved from http://gateway.webofknowledge.com/

    Online Fault Tolerance Technique for TSV-Based 3-D-IC (Journal article)

    Zhao, Y., Khursheed, S., & Al-Hashimi, B. M. (2015). Online Fault Tolerance Technique for TSV-Based 3-D-IC. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 23(8), 1567-1571. doi:10.1109/TVLSI.2014.2343156

    DOI: 10.1109/TVLSI.2014.2343156

    Diagnosis of Power Switches with Power-Distribution-Network Consideration (Conference Paper)

    Tenentes, V., Rossi, D., Khursheed, S., Al-Hashimi, B. M., & IEEE. (2015). Diagnosis of Power Switches with Power-Distribution-Network Consideration. In 2015 20th IEEE European Test Symposium (ETS). Retrieved from http://gateway.webofknowledge.com/

    NBTI and Leakage Aware Sleep Transistor Design for Reliable and Energy Efficient Power Gating (Conference Paper)

    Rossi, D., Tenentes, V., Khursheed, S., Al-Hashimi, B. M., & IEEE. (2015). NBTI and Leakage Aware Sleep Transistor Design for Reliable and Energy Efficient Power Gating. In 2015 20TH IEEE EUROPEAN TEST SYMPOSIUM (ETS). Retrieved from http://gateway.webofknowledge.com/

    2014

    Delay Test for Diagnosis of Power Switches (Journal article)

    Khursheed, S., Shi, K., Al-Hashimi, B. M., Wilson, P. R., & Chakrabarty, K. (2014). Delay Test for Diagnosis of Power Switches. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 22(2), 197-206. doi:10.1109/TVLSI.2013.2239319

    DOI: 10.1109/TVLSI.2013.2239319

    Efficient Variation-Aware Delay Fault Simulation Methodology for Resistive Open and Bridge Defects (Journal article)

    Zhong, S., Khursheed, S., Al-Hashimi, B. M., & Zhao, W. (2014). Efficient Variation-Aware Delay Fault Simulation Methodology for Resistive Open and Bridge Defects. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 33(5), 798-810. doi:10.1109/TCAD.2013.2295812

    DOI: 10.1109/TCAD.2013.2295812

    High Quality Testing of Grid Style Power Gating (Conference Paper)

    Tenentes, V., Khursheed, S., Al-Hashimi, B. M., Zhong, S., Yang, S., & IEEE. (2014). High Quality Testing of Grid Style Power Gating. In 2014 IEEE 23RD ASIAN TEST SYMPOSIUM (ATS) (pp. 186-191). doi:10.1109/ATS.2014.37

    DOI: 10.1109/ATS.2014.37

    2013

    Impact of PVT variation on delay test of resistive open and resistive bridge defects (Conference Paper)

    Zhong, S., Khursheed, S., & Al-Hashimi, B. M. (2013). Impact of PVT variation on delay test of resistive open and resistive bridge defects. In 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS). IEEE. doi:10.1109/dft.2013.6653611

    DOI: 10.1109/dft.2013.6653611

    Improved State Integrity of Flip-Flops for Voltage Scaled Retention Under PVT Variation (Journal article)

    Yang, S., Khursheed, S., Al-Hashimi, B. M., Flynn, D., & Merrett, G. V. (2013). Improved State Integrity of Flip-Flops for Voltage Scaled Retention Under PVT Variation. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 60(11), 2953-2961. doi:10.1109/TCSI.2013.2252640

    DOI: 10.1109/TCSI.2013.2252640

    2011

    Analysis of Resistive Bridge Defect Delay Behavior in the Presence of Process Variation (Conference Paper)

    Zhong, S., Khursheed, S., Al-Hashimi, B. M., Reddy, S. M., Chakrabarty, K., & IEEE. (2011). Analysis of Resistive Bridge Defect Delay Behavior in the Presence of Process Variation. In 2011 20TH ASIAN TEST SYMPOSIUM (ATS) (pp. 389-394). doi:10.1109/ATS.2011.16

    DOI: 10.1109/ATS.2011.16

    Cost-Effective TSV Grouping for Yield Improvement of 3D-ICs (Conference Paper)

    Zhao, Y., Khursheed, S., Al-Hashimi, B. M., & IEEE. (2011). Cost-Effective TSV Grouping for Yield Improvement of 3D-ICs. In 2011 20TH ASIAN TEST SYMPOSIUM (ATS) (pp. 201-206). doi:10.1109/ATS.2011.37

    DOI: 10.1109/ATS.2011.37

    Reliable State Retention-Based Embedded Processors Through Monitoring and Recovery (Journal article)

    Yang, S., Khursheed, S., Al-Hashimi, B. M., Flynn, D., & Idgunji, S. (2011). Reliable State Retention-Based Embedded Processors Through Monitoring and Recovery. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 30(12), 1773-1785. doi:10.1109/TCAD.2011.2166590

    DOI: 10.1109/TCAD.2011.2166590

    A Fast and Accurate Process Variation-Aware Modeling Technique for Resistive Bridge Defects (Journal article)

    Zhong, S., Khursheed, S., & Al-Hashimi, B. M. (2011). A Fast and Accurate Process Variation-Aware Modeling Technique for Resistive Bridge Defects. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 30(11), 1719-1730. doi:10.1109/TCAD.2011.2162065

    DOI: 10.1109/TCAD.2011.2162065

    Improved DFT for Testing Power Switches (Conference Paper)

    Khursheed, S., Yang, S., Al-Hashimi, B. M., Huang, X., Flynn, D., & Society, I. E. E. E. C. (2011). Improved DFT for Testing Power Switches. In 2011 16TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) (pp. 7-12). doi:10.1109/ETS.2011.63

    DOI: 10.1109/ETS.2011.63

    2010

    Modeling the Impact of Process Variation on Resistive Bridge Defects (Conference Paper)

    Khursheed, S., Zhong, S., Al-Hashimi, B. M., Aitken, R., Kundu, S., & IEEE. (2010). Modeling the Impact of Process Variation on Resistive Bridge Defects. In INTERNATIONAL TEST CONFERENCE 2010. Retrieved from http://gateway.webofknowledge.com/

    Test Strategies for Multivoltage Designs (Chapter)

    Khursheed, S., & Al-Hashimi, B. M. (2010). Test Strategies for Multivoltage Designs. In Power-Aware Testing and Test Strategies for Low Power Devices (pp. 243-271). Springer US. doi:10.1007/978-1-4419-0928-2_8

    DOI: 10.1007/978-1-4419-0928-2_8

    Gate-Sizing-Based Single V-dd Test for Bridge Defects in Multivoltage Designs (Journal article)

    Khursheed, S., Al-Hashimi, B. M., Chakrabarty, K., & Harrod, P. (2010). Gate-Sizing-Based Single V-dd Test for Bridge Defects in Multivoltage Designs. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 29(9), 1409-1421. doi:10.1109/TCAD.2010.2059310

    DOI: 10.1109/TCAD.2010.2059310

    Scan Based Methodology for Reliable State Retention Power Gating Designs (Conference Paper)

    Yang, S., Al-Hashimi, B. M., Flynn, D., Khursheed, S., & IEEE. (2010). Scan Based Methodology for Reliable State Retention Power Gating Designs. In 2010 DESIGN, AUTOMATION & TEST IN EUROPE (DATE 2010) (pp. 69-74). Retrieved from http://gateway.webofknowledge.com/

    2009

    Diagnosis of Multiple-Voltage Design With Bridge Defect (Journal article)

    Khursheed, S., Al-Hashimi, B. M., Reddy, S. M., & Harrod, P. (2009). Diagnosis of Multiple-Voltage Design With Bridge Defect. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 28(3), 406-416. doi:10.1109/TCAD.2009.2013540

    DOI: 10.1109/TCAD.2009.2013540

    Process Variation-Aware Test for Resistive Bridges (Journal article)

    Ingelsson, U., Al-Hashimi, B. M., Khursheed, S., Reddy, S. M., & Harrod, P. (2009). Process Variation-Aware Test for Resistive Bridges. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 28(8), 1269-1274. doi:10.1109/TCAD.2009.2021728

    DOI: 10.1109/TCAD.2009.2021728

    Test Cost Reduction for Multiple-Voltage Designs with Bridge Defects through Gate-Sizing (Conference Paper)

    Khursheed, S., Al-Hashimi, B. M., Harrod, P., & IEEE. (2009). Test Cost Reduction for Multiple-Voltage Designs with Bridge Defects through Gate-Sizing. In DATE: 2009 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, VOLS 1-3 (pp. 1349-+). Retrieved from http://gateway.webofknowledge.com/

    2008

    Bridge defect diagnosis for multiple-voltage design (Conference Paper)

    Khursheed, S., Rosinger, P., Al-Hashimi, B. M., Reddy, S. M., & Harrod, P. (2008). Bridge defect diagnosis for multiple-voltage design. In PROCEEDINGS OF THE 13TH IEEE EUROPEAN TEST SYMPOSIUM: ETS 2008 (pp. 99-+). doi:10.1109/ETS.2008.14

    DOI: 10.1109/ETS.2008.14

    Bridging fault test method with adaptive, power management awareness (Journal article)

    Khursheed, S., Ingelsson, U., Rosinger, P., Al-Hashimi, B. M., & Harrod, P. (2008). Bridging fault test method with adaptive, power management awareness. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 27(6), 1117-1127. doi:10.1109/TCAD.2008.923247

    DOI: 10.1109/TCAD.2008.923247

    2007

    Resistive bridging faults DFT with adaptive power management awareness (Conference Paper)

    Ingelsson, U., Rosinger, P., Khursheed, S. S., Al-Hashimi, B. M., & Harrod, P. (2007). Resistive bridging faults DFT with adaptive power management awareness. In PROCEEDINGS OF THE 16TH ASIAN TEST SYMPOSIUM (pp. 101-+). doi:10.1109/ATS.2007.69

    DOI: 10.1109/ATS.2007.69

    Efficient test compaction for combinational circuits based on Fault detection count-directed clustering (Journal article)

    El-Maleh, A., & Khursheed, S. (2007). Efficient test compaction for combinational circuits based on Fault detection count-directed clustering. IET COMPUTERS AND DIGITAL TECHNIQUES, 1(4), 364-368. doi:10.1049/iet-cdt:20070004

    DOI: 10.1049/iet-cdt:20070004

    2006

    Efficient static compaction techniques for sequential circuits based on reverse-order restoration and test relaxation (Journal article)

    El-Maleh, A. H., Khursheed, S. S., & Sait, S. M. (2006). Efficient static compaction techniques for sequential circuits based on reverse-order restoration and test relaxation. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 25(11), 2556-2564. doi:10.1109/TCAD.2006.873895

    DOI: 10.1109/TCAD.2006.873895

    2005

    Efficient static compaction techniques for sequential circuits based on Reverse Order Restoration and test relaxation (Conference Paper)

    El-Maleh, A. H., Khursheed, S. S., & Sait, S. M. (2005). Efficient static compaction techniques for sequential circuits based on Reverse Order Restoration and test relaxation. In 14TH ASIAN TEST SYMPOSIUM, PROCEEDINGS (pp. 378-385). doi:10.1109/ATS.2005.53

    DOI: 10.1109/ATS.2005.53